The Comparison between Samarium Doped Nickel Oxide and Samarium Added Nickel Oxide on Dielectric Properties

Abstract

In this research, the effect of Samarium Oxide (Sm) doped (mol%) NiO as a dopant and added (wt%) in NiO as ceramic composite were investigated. The comparison of both doped and added ceramic in their dielectric properties was studied. Both electroceramic Ni(1-x)SmxO and NiSmO3 were prepared by using a solid-state reaction method. Samarium was added with five different concentrations, which are 0.01, 0.02, 0.03, 0.05, and 0.10 mol% for dopant and another five different concentrations which are 1, 2, 3, 4, and 5 wt% for addition in NiO. The XRD results show that both ceramic doped and added samples did not change the NiO cubic structure. Besides, a high concentration of Sm3+ causes the lattice parameter of NiO to increase. The dielectric behavior was observed in a frequency range of 100 to 100 000 Hz. The optimum composition for Ni(1-x)SmxO and NiSmO3 was obtained at × = 0.01 mol% and 5.0 wt% sample with highest ϵ° (2.4 × 104 and 9.3 × 104) respectively but at the same time, they exhibit high dielectric loss (tan δ) with value 4.9 and 10.5 respectively.